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MICRON 6500 ION (Micron)
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| Warranty (years) | 5 |
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| Interface | PCIe NVMe |
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| Idle Power W | 5 |
| Capacity Tb | 30.72 |
| Drive Form Factor | U.3 |
| Nand Type | QLC |
| Media Type | ssd |
| Document Revision | |
| Nand | |
| Product Name |
| Operating temp max (°C) | 0°C to 70°C |
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| SKU | MICRON 6500 ION |
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| Available form factors | |
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| Capacity (product image caption) | |
| NAND layers (intro) |
| Average read latency improvement vs competing QLC SSD |
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| Sequential writes improvement vs competing QLC SSD |
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| 4KB random read IOPS improvement vs competing QLC SSD |
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| 4KB random write IOPS improvement vs competing QLC SSD |
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| Ideal workloads |
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| Power consumption reduction vs competing QLC SSD |
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| Power efficiency improvement (IOPS/watt) vs competing QLC SSD |
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| 4KB random write endurance improvement vs competing QLC SSD |
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| Storage density |
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| Die density leadership |
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| Supply chain |
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| Compliance/security positioning |
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| Feature set |
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| Sequential 128KB reads |
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| Sequential 128KB writes |
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| Random 4KB reads |
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| Random 4KB read latency |
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| Random 4KB writes |
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| Mixed 4KB 70/30 random reads/writes |
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| Mixed 4KB 70/30 random read latency |
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| Endurance (100% random writes) |
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| Lower active power consumption |
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| Server consolidation capacity |
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| Superior NAND die density |
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| Security feature - SPDM |
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| Security feature - compliance |
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| Security feature - hash algorithm |
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| Security feature - SED |
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| Future-proofed specs / industry standards |
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| SRIS / EMI |
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| Full enterprise feature set |
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| Architecture |
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| Sequential Read (MB/s, QD128) |
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| Sequential Write (MB/s, QD128) |
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| Random Read (IOPS, QD128) |
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| Random Write (IOPS, QD128) |
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| 70/30 Random Read/Write (IOPS, QD128) |
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| Read Latency (µs, QD1, typical) |
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| Write Latency (µs, QD1, typical) |
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| Active average power, RMS |
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| Power Consumption - Read |
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| Power Consumption - Write |
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| Endurance - 100% 128KB Sequential Writes |
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| Endurance - 90% 128KB Sequential Write / 10% 4KB Random Write |
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| Endurance - 70% 128KB Sequential Write / 30% 4KB Random Write |
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| Endurance - 50% 128KB Sequential Write / 50% 4KB Random Write |
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| Endurance - 100% 4KB Random Writes |
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| Reliability - MTTF (0-50°C) |
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| Reliability - UBER |
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| Part number example (configuration-dependent fields in bold) |
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| Part number - Drive Form Factor option CC |
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| Part number - Drive Form Factor option BN |
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| Part number - Extended Firmware Features option J |
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| Part number - Extended Firmware Features option D |
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| Part number - Sector Size option 1 |
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| Part number - Sector Size option 4 |
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| Performance test conditions |
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| Copyright |
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